Pendulum Instruments · EMC Scanners
HRE Series
25 μm ultra-high-resolution 3D/4D near-field EMC scanners that pin an emission down to the part that radiates it
When an EMC test fails and you need to know which component on the board is radiating, the HRE narrows the search to part level. The minimum step is 25 μm with ±0.02 mm positioning accuracy, and the 4D models rotate the probe through 0°–360° in 1° steps, so you learn not only where the energy leaves the board but also its polarization. Scan volume depends on the model: 280×180×85 mm (HRE-02/42) or 390×280×130 mm (HRE-03/43). Before ordering, settle two things: the real size of the boards you test, and whether you need probe rotation, because polarization data is often what reveals the coupling path.
Overview
The slow part of an EMC failure is not the retest, it is finding the cause. A far-field measurement tells you by how much you exceeded the limit, not which trace, which switching device or which broken ground return is responsible. Near-field scanning brings the measurement down to the board surface, records field strength point by point at 25 μm spacing and overlays it on a photo of the board, so hot spots appear at their physical location. The HRE resolves neighboring components and traces, which on a dense board is the difference between locating and guessing. The 4D models add one more dimension: reading the same point at different probe angles reveals the polarization of the field, and polarization tends to point at the true coupling path rather than merely the strongest spot. In practice the scanner is used for pre-compliance checks during design, root-cause work after a failure, and before-and-after comparison of a layout change; with identical scan settings the improvement becomes a number.
Key specifications
| Minimum scan step | 25 μm |
|---|---|
| Positioning accuracy | ±0.02 mm |
| Probe rotation (4D models) | 0°–360°, 1° resolution |
| Scan volume (small, HRE-02 / HRE-42) | 280 × 180 × 85 mm (X × Y × Z) |
| Scan volume (large, HRE-03 / HRE-43) | 390 × 280 × 130 mm (X × Y × Z) |
| Standard probe kit frequency range | 3 GHz or 6 GHz probe kit (HRE-xx/3G or /6G); upgradable to 10 GHz as an option |
| Extended measurement frequency | The software sets no frequency limit; higher-frequency near-field probes supplied by the user, for example to 70 GHz, can normally be attached, provided the spectrum analyzer covers the range |
| Scanner dimensions (large models) | 780 × 850 × 810 mm (W × H × D, HRE-03 / HRE-43) |
| Scanner net weight | HRE-02 / HRE-42: 95 kg; HRE-03 / HRE-43: 150 kg |
| Shipping weight (HRE-02 / HRE-42) | Approx. 155 kg |
| Shipping weight (HRE-03 / HRE-43) | Approx. 170 kg |
| Communication interfaces | RS-232 (9-pin D-Sub female) and Ethernet RJ45, 10/100 Mbps |
Features
25 μm steps
Resolution fine enough to separate neighboring parts and traces on a dense board, so you locate a component, not a region.
±0.02 mm positioning
Scans before and after a layout change overlay directly, so the improvement is a measured value rather than an impression.
4D probe rotation
0°–360° in 1° steps gives polarization data that points at the real coupling path instead of just the hottest spot.
Two scan volumes
280×180×85 mm or 390×280×130 mm; choose by the actual size of the boards you test.
Find it before the test house does
Pre-compliance checks during design cost far less than a board respin after a failed certification.
Comparable from scan to scan
Built-in Calibrate to Beacon keeps repeated scans consistent, which is what makes a before-and-after comparison meaningful.
Typical applications
R&D debugging
Locate EMI hot spots early in design and stop the retest cycle
Before a board goes to a third-party test lab, engineers scan it with the HRE and pin interference hot spots to a component, or even inside an IC, at 25 μm steps. A test lab reports which frequency failed; the HRE shows where it comes from, so the fix is targeted and the board passes without paying for repeated certification runs.
Design verification
Compare layout revisions and judge a design change by the numbers
For high-emission designs such as GaN power modules and fast digital boards, engineers scan each revision in 3D and use the subtraction view in DSS to overlay them, confirming whether the new layout suppresses near-field emission in the band of interest and backing routing and decoupling decisions with data.
QA sampling
Incoming-material checks so a part substitution does not change EMC behavior
Manufacturing stores the scan of a known-good first board as a baseline map. Whenever a supplier part changes or a process is adjusted, the same scan is repeated and compared, quickly confirming the new material has not shifted the emission spectrum and keeping every production batch within the EMC limits.
Options and configuration
Tick the options you need; we compile the configuration list and carry it into the quote form.
Standard equipment (included)
Model and scan dimension options
Hardware options / software options
Downloads
- Product datasheetDatasheet · PDF
- Manufacturer document pagePendulum Instruments · Discontinued Products
This model is on the Pendulum Instruments discontinued-products list and is no longer supported by the factory; the current near-field EMC scanner line is the SCN series. New projects should go straight to the current model, while repair, calibration and spare-part needs for existing units can be assessed separately. The factory datasheet and user manual are still available for download from the discontinued-products page.
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