Pendulum Instruments · EMI Scanners
SCN Series
Near-field EMI scanning that locates the source of an emission and raises design quality
The SCN series is the general-purpose choice for near-field EMI scanning: 0.1 mm minimum step and four scan tables from 200×100 mm up to 600×400×300 mm, so you pick by the size of the test object, and the largest table takes a complete product, not just a bare board. Frequency coverage is 3, 6 or 10 GHz depending on the preamplifier option. The SCN-522 scans a 2D plane; the SCN-524, 534 and 564 are 4D, adding 3D movement and probe rotation. The most practical selection rule is object size: if it does not fit on the table nothing gets measured, and that limit bites before resolution does.
Overview
Near-field scanning answers one question, where does the radiation come from, and whether it can answer depends first on whether the object fits. That is why the SCN series comes in four table sizes: the small units suit modules and bare boards, while the 600×400×300 mm table holds a complete product, so you measure the unit in the state it ships rather than a daughterboard pulled out of it. Many coupling problems only appear once the product is assembled. A 0.1 mm step is enough for most board-level localization; when you need to resolve finer structures, the HRE in the same family offers 25 μm. In scan modes, the 2D unit sweeps a plane at fixed height, while the 4D units add Z-axis movement and probe rotation, giving you the fall-off with height and the polarization of the field. The frequency ceiling is set by the preamplifier, with 3, 6 and 10 GHz to choose from; match it to the operating band of the DUT and its harmonics, because when the range stops short of the harmonics, the band you most need to see is usually the one outside it.
Key specifications
| Minimum step size | 0.1 mm |
|---|---|
| Frequency range (standard probe kit) | Up to 3 GHz, 6 GHz or 10 GHz (depending on the preamplifier option) |
| Scan modes | 2D (SCN-522) / 4D, 3D movement plus probe rotation (SCN-524 / 534 / 564) |
| Scan table XY (XYZ) | 200×100 mm | 200×100×100 mm | 300×200×100 mm | 600×400×300 mm |
| Scanner dimensions | SCN-522: 450×370×430 mm | SCN-524: 450×370×630 mm | SCN-534: 550×470×630 mm | SCN-564: 850×670×830 mm (W × D × H) |
| Net weight | SCN-522: approx. 11 kg | SCN-524: approx. 13 kg | SCN-534: approx. 15 kg | SCN-564: approx. 23 kg |
| Power input | 100–240 Vac, 50 Hz / 60 Hz, 45 W |
| Communication interface | USB 2.0 |
| Operating system | Windows 10 or later |
| Operating temperature | +10°C to +35°C |
| Laser distance meter (option SLDM) | Class 2, 1 mW, 670 nm wavelength |
| Maximum operating altitude | 2000 m |
Features
Four scan table sizes
From 200×100 mm to 600×400×300 mm; a full product or a bare board fits, so you can scan the unit as it ships.
0.1 mm steps
Enough resolution for board-level localization; when you need finer, the HRE in the same family offers 25 μm.
2D or 4D
The 4D units add the Z axis and probe rotation, giving height fall-off curves and polarization direction.
Frequency ceiling follows the probe kit
3, 6 or 10 GHz; choose to cover the harmonics of the operating frequency, not just the fundamental.
Whole-product measurement
The large table takes the assembled product, exposing coupling problems that only show up in the complete unit.
Useful in R&D and in production
Beyond pre-compliance work during design, it screens incoming material for EMI in volume production, so the scanner earns its keep after the project ends.
Typical applications
R&D verification
Fast localization of emission sources during board design
Before a product goes to the formal EMC test lab, engineers run a high-resolution near-field scan (0.1 mm step) with the SCN and read the radiating components or trace segments straight off the heat map, then fix the layout or add shielding where it matters, avoiding the cost of late rework.
Design comparison
Objective comparison of several circuit layout versions
The R&D team places two or more layout candidates on the table in turn and uses the repeatable scans of the SCN to overlay their interference maps at the same frequencies, showing with data which version has the fewest internal EMI hot spots, so the design decision rests on measurement rather than a visual judgment.
Production QA
Production sampling to keep supplier components consistent
During volume production the manufacturer samples boards built with a substitute IC or module and compares their near-field maps with the verified baseline. If a new batch radiates outside the allowed range it is caught before shipment, so a part change cannot silently void the EMC certification of the whole product.
Options and configuration
Tick the options you need; we compile the configuration list and carry it into the quote form.
Model and scan range
Hardware options
Software options
Downloads
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