ABI Electronics · PCB Fault Diagnosis
SYSTEM 8 Advanced Matrix Scanner (AMS)
V-I signature tester with frequency sweep that raises PCB fault coverage with the board unpowered.
The SYSTEM 8 Advanced Matrix Scanner (AMS) is the newest member of the SYSTEM 8 range. It applies V-I signature testing to components and complete PCB assemblies with the board safely unpowered. By sweeping the test signal frequency and presenting the change in 3D, the AMS reveals internal damage and abnormal parts that standard V-I analysis does not, giving repair engineers more fault coverage in less diagnosis time. Evencat is an authorized distributor for ABI Electronics in Taiwan.
Overview
The SYSTEM 8 Advanced Matrix Scanner (AMS) is an ABI Electronics module for fault diagnosis on analog and digital boards. It applies a current-limited AC voltage to a test point, measures the resulting current and plots the V-I signature of that point. What sets the AMS apart is the frequency sweep: the AC signal is varied from 100 Hz to 10 kHz and the signature change is shown in three dimensions, so leaky parts, internal damage, wrong values and inconsistent components stand out. All tests run with power off, which protects the parts and lets boards that cannot be powered at all be diagnosed. Each module carries 64 test channels (expandable to 2,048) plus 4 probes, so high pin count devices and whole boards are captured quickly; matrix V-I mode uses multiple references to capture every pin against every other pin and produce far more data for the most hidden faults. Pulse outputs support dynamic V-T testing, and automatic live and stored-mask comparison gives the verdict. Users are in aerospace, rail, defense, automotive and industrial maintenance.
Key specifications
| Test channels | 64 channels + 4 probes (per module, expandable to 2,048 channels) |
|---|---|
| Test voltage | 2 V to 50 V peak-to-peak |
| Voltage resolution | 12-bit output waveform, 10-bit acquired waveform |
| Test frequency (static) | 1 Hz to 10 kHz |
| Test frequency (sweep) | 100 Hz to 10 kHz |
| Test current | 1 µA to 250 mA |
| Source impedance | 100 Ohm to 1 MOhms |
| Waveform modes | V-I, V-T |
| Waveform display | Multiple plots with single-waveform zoom; 3D projection with frequency plane |
| Pulse outputs | 4; up to 4 cycles per channel; amplitude adjustable to ±10 V |
| Comparison tolerance (mask) | User adjustable, 2% to 25% of full scale |
| Package support | Probes, DIL, SOIC |
Features
Frequency-swept V-I signatures
The test signal frequency is varied from 100 Hz to 10 kHz and the V-I signature is drawn as a 3D curve against frequency, exposing faults that a standard V-I analysis misses.
Safe power-off diagnosis
Every signature is taken with the board unpowered, so the risk of damaging parts is low, boards that will not power up at all can still be diagnosed, and semi-skilled operators can work safely.
Matrix V-I with multiple references
Matrix mode captures the V-I signature of every pin against every other pin (a 20-pin device yields 400 signatures), finding hidden faults a single reference point cannot.
64-channel fast acquisition
Each module has 64 test channels (expandable to 2,048), so high pin count devices and complete board assemblies are captured in one pass instead of pin by pin.
Pulsed dynamic V-T test
4 configurable pulse outputs, amplitude adjustable to ±10 V and up to 4 pulse cycles per channel, support dynamic V-T analysis and widen the range of testable devices.
Automatic comparison and mask verdict
Live and stored waveforms are compared automatically against a mask for a pass/fail verdict; the tolerance is user adjustable, which makes repeatable test procedures easy to build.
Applications
Repair support
Diagnose a damaged board that cannot be powered
When a board cannot be powered safely after overvoltage, burn damage or an unknown event, the AMS sweeps V/I signatures over several frequencies with power off and compares the impedance fingerprint of each pin. Shorts, opens and damaged parts are located quickly; rail operators (SNCF, Taipei Metro), aerospace and defense depots use it for field repair.
High-density IC test
Fast scanning of high pin count ICs and complex modules
With 64 channels standard and expansion to 2048, the AMS contacts every pin of a BGA, FPGA or DSP through a multi-channel connector, runs the frequency sweep automatically and produces a signature curve per pin. It replaces pin-by-pin manual measurement in R&D labs doing failure analysis and reliability work on complex boards.
Incoming QC
Automated incoming inspection and manufacturing defect analysis
With TestFlow Manager sequences, engineers build a V/I fingerprint database from known-good boards, then scan incoming PCB batches unpowered and compare. Poor joints, missing or wrong parts are flagged automatically and a QA report is produced for line QC and supplier audits.
Options and configuration
Tick the options you need. We compile the configuration into a list and carry it into the quote form.
Standard package (included)
Hardware options
Downloads
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