ABI Electronics · Board Fault Location
SYSTEM 8 Board Fault Locator (BFL)
Pinpoints faulty analog, digital and mixed components on the board itself
The SYSTEM 8 Board Fault Locator (BFL) is the module a repair engineer reaches for when a board is dead and there is no schematic. It combines several established test techniques to functionally test common digital ICs in-circuit and out-of-circuit, then points at the failed device or joint. It finds faulty ICs, open tracks, shorts, floating inputs, outputs stuck at an intermediate level, dry joints and leaky nodes, which is why it sits on the bench of electronics repair and warranty labs. Evencat is the authorized distributor for ABI Electronics in Taiwan.
Overview
The BFL is built for fault coverage rather than speed: it functionally tests analog, digital and mixed components on the board, from discrete diodes and transistors up to complex integrated circuits. Tests run in-circuit or out-of-circuit for TTL and CMOS logic, and the result names the faulty IC, open track, short, floating input, intermediate-level output, dry joint or leaky node. The device library runs from NAND gates to CPUs and covers DIL, SOIC, PLCC and QFP packages, through-hole and surface-mount alike. Built-in tools include the Digital V-I Tester, Digital IC Identifier, EPROM Verifier and Short Locator; TestFlow Manager and the Graphical Test Generator let you build standard or custom logic tests. The base system has 64 channels and grows in 64-channel steps to 256, with live comparison of a known-good board against the suspect one. Decide the channel count from the widest device you expect to test, not from today's board.
Key specifications
| Test method | In-circuit and out-of-circuit testing |
|---|---|
| Logic families | TTL or CMOS |
| Base channel count | 64 channels |
| Channel expansion | In 64-channel steps, up to 256 channels |
| Supported packages | DIL, SOIC, PLCC, QFP (through-hole and surface-mount) |
| Device library range | From NAND gates to CPUs |
| Built-in test tools | Digital V-I Tester, Digital IC Identifier, EPROM Verifier, Short Locator |
| Test creation | TestFlow Manager, Graphical Test Generator (standard and custom logic) |
| Installation | Inside a PC chassis (one free CD-ROM bay) or in the external MultiLink chassis (USB) |
Features
Locates the fault, not just the symptom
Identifies and locates faulty ICs, open tracks, shorts, floating inputs, intermediate-level outputs, dry joints and leaky nodes, so the engineer goes straight to the problem.
In-circuit and out-of-circuit
Functionally tests common digital ICs in-circuit or out-of-circuit (TTL or CMOS), combining several proven techniques for high fault coverage.
Wide package and device support
Covers DIL, SOIC, PLCC and QFP packages, through-hole and surface-mount, with a device library from NAND gates to CPUs.
Expandable channel architecture
64 channels as standard, expandable in 64-channel steps to 256, with live comparison of good and faulty boards.
Integrated tool set
Digital V-I Tester, Digital IC Identifier, EPROM Verifier and Short Locator are built in, so one module covers most diagnostic needs.
Graphical test generation
TestFlow Manager and the Graphical Test Generator build standard and custom logic tests and keep test flows organized.
Applications
Electronics manufacturing and repair
In-circuit IC functional testing on SMT and through-hole boards
After assembly, engineers test the board's TTL/CMOS digital ICs in-circuit (DIL, SOIC, PLCC and QFP packages) without desoldering, confirm that each IC operates and is wired correctly, and cut fault-finding time on the production floor and at the repair station.
Aerospace and defense MRO
Comparison testing and fault location on mission-critical boards
Maintenance organizations in aerospace, defense and rail compare a suspect board against a known-good one live on up to 256 channels, isolate the differing component quickly, and keep obsolete boards in service after parts go end-of-life and OEM support stops.
Unpowered board diagnosis
V-I signature scan for shorts and degraded components
With the board unpowered, V-I signature analysis detects shorts, opens and abnormal component characteristics. It suits boards returned from the field and the safety check before high-voltage equipment is repaired, reducing the risk of damage on power-up.
Options and configuration
Tick the options you need; the configuration list is carried into the quote request.
Standard configuration (included)
Hardware options: channel expansion and interface
Optional accessories: clips and probes
Downloads
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