ABI Electronics · Memory IC Test Module
SYSTEM 8 Memory IC Tester (MES)
In-circuit and out-of-circuit functional test and fault diagnosis of memory ICs on the SYSTEM 8 modular platform
The SYSTEM 8 Memory IC Tester is the memory-test role of the ABI Electronics SYSTEM 8 diagnostic platform. You type the part number, and the built-in device library runs functional, pin-connection, voltage, thermal and V-I signature tests on memory-class ICs. The library covers Memory, Microprocessor, TTL, CMOS, Interface and LSI classes, so a faulty device can be judged on the board without a circuit diagram. Repair shops, production test and defense, aerospace and rail operators who must extend the life of installed equipment are the usual buyers. Evencat is an authorized distributor for ABI Electronics in Taiwan.
Overview
ABI Electronics has designed and built test and diagnostic instruments in the UK since 1983. SYSTEM 8 is its modular component and board test platform: you combine the modules you need and drive them from a PC with the System 8 Premier software. Memory ICs are tested by the digital modules. The entry-level Board Fault Locator (BFL) gives 64 test channels, expandable to 256; the Advanced Test Module (ATM) gives 64 channels per module, expandable to 2,048. The device library explicitly lists Memory and Microprocessor classes and supports the TTL, CMOS, LVTTL, ECL, DTL, LSI, RTL, PECL and LVPECL logic families, in DIL, SOIC, PLCC and QFP packages. Five test methods are available: functional (truth-table or library driven), connection (MDA), voltage, thermal and V-I signature. Memory ICs can be diagnosed in-circuit on the board or out-of-circuit with an adapter. An EPROM verifier and an IC identifier are included. The product is built under ISO 9001 and is used in manufacturing, repair, aerospace, defense and rail.
Key specifications
| Platform | ABI SYSTEM 8 modular test system |
|---|---|
| Device library classes | Memory, Microprocessor, TTL 54/74 logic, CMOS, Interface, LSI, PAL/EPLD, Linear, Package, Special and others |
| Logic families | TTL, CMOS, LVTTL, ECL, DTL, LSI, RTL, PECL, LVPECL |
| Test methods | Functional (truth table / library driven), Connection (MDA), Voltage, Thermal, V-I signature |
| Test modes | In-circuit / Out-of-circuit (with adapter) |
| Test channels (BFL) | 64 channels, expandable to 256 channels |
| Test channels (ATM) | 64 channels per module, expandable to 2,048 channels |
| Package support | DIL, SOIC, PLCC, QFP |
| Driver output current (BFL) | Typical H-L 80mA @ 0.6V, L-H 200mA @ 2V, maximum 400mA |
| Threshold resolution (BFL) | 100mV |
| On-board power supply (BFL) | 1 x 5V @ 5A (2 x 5V @ 5A with 128 channels) |
| Other functions | EPROM verifier, IC identifier |
Features
Memory and microprocessor library
The large built-in device library has explicit Memory and Microprocessor classes. Enter the part number and the memory IC gets a library-driven functional test; no circuit diagram is needed.
In-circuit and out-of-circuit
Test directly on the board in-circuit, or isolate the device in an out-of-circuit adapter to screen new parts before fitting or to remove the influence of surrounding components.
Five test methods
Functional, Connection, Voltage, Thermal and V-I signature tests cover function, pin connection, voltage and internal structure, so a faulty memory IC is pinned down quickly.
Expandable channel count
The BFL module starts at 64 channels and expands to 256; ATM modules give 64 channels each and expand to 2,048, covering both component-level and board-level test.
Part of SYSTEM 8
Works with the other SYSTEM 8 modules (AICT, ATS, MIS, VPS and more) under the System 8 Premier software, so you assemble the test solution your bench actually needs.
Made in the UK · ISO 9001
ABI Electronics has designed and built in the UK since 1983 under ISO 9001, with users in aerospace, defense, rail and industrial repair.
Applications
Board repair
Identify the faulty memory chip and shorten repair downtime
When an industrial controller, communications unit or embedded board fails to boot or corrupts data, the repair engineer probes the SRAM, DRAM, EPROM or Flash in-circuit with the MES. A pass/fail verdict comes without desoldering, the faulty chip is found quickly and mean time to repair (MTTR) drops.
Incoming inspection
Screen memory ICs at incoming inspection before they reach the line
An electronics or board assembly plant can put the MES at the IQC station. Sampled memory ICs get a functional read/write test and a bad-cell scan, so out-of-spec or counterfeit parts are caught before they enter the SMT or DIP line and cause rework downstream.
R&D verification
Verify the memory subsystem on a prototype board and close the design faster
During PCB bring-up, the lab needs to confirm address decoding, timing interface and read/write integrity against the design. The MES exercises the memory chip over its full address range before the firmware is complete, so hardware engineers can separate a defective memory device from a circuit design problem and shorten the DVT cycle.
Options and configuration
Tick the options you need. We compile the configuration into a list and carry it into the quote form.
Standard package (included)
Package test clips (hardware options)
Software options
Downloads
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